Defect engineering by synchrotron radiation X-rays in CeO2 nanocrystals

TitleDefect engineering by synchrotron radiation X-rays in CeO2 nanocrystals
Publication TypeJournal Article
AuthorsWu T-S, Syu L-Y, Weng S-C, Jeng H-T, Chang S-L, Soo Y-L
JournalJournal of Synchrotron Radiation
Volume25
Pagination1395-1399
ISSN1600-5775
Abstract

This work reports an unconventional defect engineering approach using synchrotron-radiation-based X-rays on ceria nanocrystal catalysts of particle sizes 4.4-10.6nm. The generation of a large number of oxygen-vacancy defects (OVDs), and therefore an effective reduction of cations, has been found in CeO2 catalytic materials bombarded by high-intensity synchrotron X-ray beams of beam size 1.5mmx0.5mm, photon energies of 5.5-7.8keV and photon fluxes up to 1.53x10(12) photons s(-1). The experimentally observed cation reduction was theoretically explained by a first-principles formation-energy calculation for oxygen vacancy defects. The results clearly indicate that OVD formation is mainly a result of X-ray-excited core holes that give rise to valence holes through electron down conversion in the material. Thermal annealing and subvalent Y-doping were also employed to modulate the efficiency of oxygen escape, providing extra control on the X-ray-induced OVD generating process. Both the core-hole-dominated bond breaking and oxygen escape mechanisms play pivotal roles for efficient OVD formation. This X-ray irradiation approach, as an alternative defect engineering method, can be applied to a wide variety of nanostructured materials for physical-property modification.

Notes

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DOI10.1107/S1600577518008184
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