Title | High Temperature Structural Study of Gd-Doped Ceria by Synchrotron X-ray Diffraction (673 K ≤ T ≤ 1073 K) |
Publication Type | Journal Article |
Authors | Artini C, Pani M, Lausi A, Masini R, Costa GA |
Journal | Inorganic Chemistry |
Volume | 53 |
Issue | 19 |
Pagination | 10140-10149 |
ISSN | 0020-1669 |
Abstract | The crystallographic features of Gd-doped ceria were investigated at the operating temperature of solid oxides fuel cells, where these materials are used as solid electrolytes. (Ce1–xGdx)O2-x/2 samples (x = 0.1, 0.3, 0.5, 0.7) were prepared by coprecipitation of mixed oxalates, treated at 1473 K in air, and analyzed by synchrotron X-ray diffraction in the temperature range 673 K ≤ T ≤ 1073 K at the Elettra synchrotron radiation facility located in Trieste, Italy. In the whole temperature span a boundary was found at x ∼ 0.2 between a CeO2-based solid solution (for x ≤ 0.2) and a structure where Gd2O3 microdomains grow within the CeO2 matrix, taking advantage of the similarity between Gd3+ and Ce4+ sizes; the existence of the boundary at x ∼ 0.2 was confirmed also by measurements of ionic conductivity performed by impedance spectroscopy. Similar to what observed at room temperature, the trend of the cell parameter shows the presence of a maximum; with increasing temperature, the composition corresponding to the maximum moves toward lower Gd content. This evidence can be explained by analyzing the behavior of the coefficient of thermal expansion as a function of composition. |
Notes | 'doi: 10.1021/acsenergylett.0c01132\n - I.Am.Hydrogen' |
URL | https://doi.org/10.1021/ic5011242 |
DOI | 10.1021/ic5011242 |
High Temperature Structural Study of Gd-Doped Ceria by Synchrotron X-ray Diffraction (673 K ≤ T ≤ 1073 K)
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